Thursday, March 3, 2016

Figure 1. ASML Lithography projection system for Chip fabrication (Intercept from Reference 1)

Lithography system
Figure 2. Basic Absolute testing setup in Fizeau interferemeter( from left to right: Plansurface testing; Concave surface testing; Convex surface testing)

Figure 3.Error source in Fizeau Interferometer surface testing